Attention Modules Improve Image-Level Anomaly Detection for Industrial Inspection: A DifferNet Case Study

Published in WACV '24 (Winter Conference on Applications of Computer Vision), 2024

Vieira e Silva, André Luiz Buarque, Francisco Simões, Danny Kowerko, Tobias Schlosser, Felipe Battisti, Veronica Teichrieb. "Attention Modules Improve Image-Level Anomaly Detection for Industrial Inspection: A DifferNet Case Study." arXiv preprint arXiv:2311.02747 (2023). ttps://arxiv.org/abs/2311.02747